Hidden Bibliographic Details
| ISBN: | 9783030136543
303013654X
3030136531
9783030136536
9783030136550
3030136558
9783030136567
3030136566
9783030136536
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| Digital file characteristics: | text file PDF
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| Notes: | Includes bibliographical references and index.
Online resource; title from PDF title page (Ebsco, viewed May 29, 2019).
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| Summary: | This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
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| Other form: | Printed edition: 9783030136536
Printed edition: 9783030136550
Printed edition: 9783030136567
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| Standard no.: | 10.1007/978-3-030-13
10.1007/978-3-030-13654-3
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