Applied charged particle optics /
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Author / Creator: | Liebl, Helmut. |
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Imprint: | Berlin : Springer, c2008. |
Description: | 1 online resource (x, 130 p.) : ill. |
Language: | English |
Subject: | Electron optics. Particle beams. SCIENCE -- Physics -- Nuclear. SCIENCE -- Physics -- Atomic & Molecular. Electron optics. Particle beams. Electronic books. |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8885229 |
Summary: | Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. |
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Physical Description: | 1 online resource (x, 130 p.) : ill. |
Bibliography: | Includes bibliographical references and index. |
ISBN: | 9783540719250 3540719253 3540719245 9783540719243 |