Applied charged particle optics /

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Bibliographic Details
Author / Creator:Liebl, Helmut.
Imprint:Berlin : Springer, c2008.
Description:1 online resource (x, 130 p.) : ill.
Language:English
Subject:Electron optics.
Particle beams.
SCIENCE -- Physics -- Nuclear.
SCIENCE -- Physics -- Atomic & Molecular.
Electron optics.
Particle beams.
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8885229
Hidden Bibliographic Details
ISBN:9783540719250
3540719253
3540719245
9783540719243
Notes:Includes bibliographical references and index.
Description based on print version record.
Other form:Print version: Liebl, Helmut. Applied charged particle optics. Berlin : Springer, c2008 3540719245 9783540719243
Description
Summary:

Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.

Physical Description:1 online resource (x, 130 p.) : ill.
Bibliography:Includes bibliographical references and index.
ISBN:9783540719250
3540719253
3540719245
9783540719243