Characterization and behavior of materials with submicron dimensions : proceedings from the conference /

Characterization and behavior of materials with submicron dimensions : proceedings from the conference /

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Bibliographic Details
Imprint:	Singapore : World Scientific, c1985.
Description:	xii, 205 p. : ill. ; 24 cm.
Language:	English
Subject:	Free electron theory of metals -- Congresses. Electric conductivity -- Congresses. Transport theory -- Congresses. Electric conductivity. Free electron theory of metals. Transport theory. Conference papers and proceedings.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/875608

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Other authors / contributors:	Waber, James T. (James Thomas), 1920- Metallurgical Society of AIME. Alloy Phases Committee American Society for Metals. Electrical, Magnetic, and Optical Phenomena Committee
ISBN:	9971500426
Notes:	Includes bibliographies.

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Call Number:	QC176.8.E4C530 1985
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