Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposia held April 14-16, 2009, San Francisco, California, USA /

Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposia held April 14-16, 2009, San Francisco, California, USA /

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Bibliographic Details
Meeting name:	Symposium GG, "Electron Crystallography for Materials Research" (2009 : San Francisco, Calif.)
Imprint:	Warrendale, Pa. : Materials Research Society, c2009.
Description:	211 p. : ill. ; 24 cm.
Language:	English
Series:	Materials Research Society symposium proceedings ; v. 1184 Materials Research Society symposia proceedings ; v. 1184.
Subject:	Crystallography -- Congresses. Electron microscopy -- Congresses. Nanocrystals -- Congresses. Crystallography. Electron microscopy. Nanocrystals. Conference papers and proceedings.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/7907693

Hidden Bibliographic Details
Other authors / contributors:	Moeck, Peter. Bridges, Frank George Baskerville, 1940- Symposium HH, "Quantitative Characterization of Nanostructured Materials" (2009 : San Francisco, Calif.)
ISBN:	9781605111575 1605111570
Notes:	"Symposium GG, 'Electron Crystallography for Materials Research,' held April 13-14 at the 2009 MRS Spring Meeting in San Francisco, California"--P. [ix]. "Symposium HH, 'Quantitative Characterization of Nanostructured Materials,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California"-- P. [xi]. Includes bibliographical references and indexes.
Other form:	Online version: Symposium GG, "Electron Crystallography for Materials Research" (2009 : San Francisco, Calif.) Electron crystallography for materials research and quantitative characterization of nanostructured materials. Warrendale, Pa. : Materials Research Society, c2009

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Call Number:	QD906.7.E37 E43 2009
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