Measurements of complex permittivity of microwave substrates in the 20 to 300 K temperature range from 26.5 to 40.0 GHz /

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Bibliographic Details
Imprint:[Washington, D.C.] : National Aeronautics and Space Administration, [1989]
Description:8 pages : digital, PDF file.
Language:English
Series:NASA technical memorandum ; 102123
NASA technical memorandum ; 102123.
Format: E-Resource U.S. Federal Government Document Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/7627433
Hidden Bibliographic Details
Other authors / contributors:Miranda, Félix A.
United States. National Aeronautics and Space Administration.
Notes:Title from title screen (viewed Jan. 29, 2009)
Mode of access: Internet from the NTRS web site. Address as of 1/29/09: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19890017667%5F1989017667.pdf ; current access is available via PURL.
Other form:Measurements of complex permittivity of microwave substrates in the 20 to 300 K temperature range from 26.5 to 40.0 GHz. 1 v.
GPO item no.:0830-D (online)
Govt.docs classification:NAS 1.15:102123

MARC

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500 |a Title from title screen (viewed Jan. 29, 2009) 
650 7 |a Dielectrics.  |2 nasat 
650 7 |a High temperature superconductors.  |2 nasat 
650 7 |a Microwaves.  |2 nasat 
650 7 |a Permittivity.  |2 nasat 
650 7 |a Substrates.  |2 nasat 
650 7 |a Superconducting films.  |2 nasat 
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