The ethics of technological risk /

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Bibliographic Details
Imprint:London ; Sterling, VA : Earthscan, 2009.
Description:xii, 290 p. ; 24 cm.
Language:English
Series:Risk, society, and policy series
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/7547334
Hidden Bibliographic Details
Other authors / contributors:Asveld, Lotte.
Roeser, Sabine.
ISBN:9781844076383 (hardback)
1844076385 (hardback)
Notes:Includes index.

Regenstein, Bookstacks

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Holdings details from Regenstein, Bookstacks
Call Number: T174.5 .E84 2009
c.1 Available Loan period: standard loan  Scan and Deliver Request for Pickup Need help? - Ask a Librarian