Distribution theory of runs and patterns and its application : a finite Markov chain imbedding approach /

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Bibliographic Details
Author / Creator:Fu, James C.
Imprint:[River Edge] New Jersey : World Scientific, c2003.
Description:x, 162 p. : ill. ; 24 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/4966398
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Other authors / contributors:Lou, W. Y. Wendy.
ISBN:9810245874 (alk. paper)
Notes:Includes bibliographical references (p. 153-160) and index.
Table of Contents:
  • Ch. 1. Introduction
  • Ch. 2. Finite Markov Chain Imbedding
  • 2.1. Finite Markov Chain
  • 2.2. Chapman-Kolmogorov Equation
  • 2.3. Tree-Structured Markov Chain
  • 2.4. Runs and Patterns
  • 2.5. Finite Markov Chain Imbedding
  • 2.6. Absorbing State
  • 2.7. First-Entry Probability
  • Ch. 3. Runs and Patterns in a Sequence of Two-State Trials
  • 3.1. Introduction
  • 3.2. Number of Non-Overlapping Consecutive k Successes
  • 3.3. Number of Success Runs of Length Greater Than or Equal to k
  • 3.4. Number of Overlapping Consecutive k Successes
  • 3.5. Number of Runs of Exactly k Successes
  • 3.6. The Distribution of the Longest Success Run
  • 3.7. Waiting-Time Distribution of a Success Run
  • 3.8. Numerical Examples
  • 3.9. Number of Successes in Success Runs of Length Greater Than or Equal to k
  • Ch. 4. Runs and Patterns in Multi-State Trials
  • 4.1. Introduction
  • 4.2. Forward and Backward Principle with Non-Overlap Counting
  • 4.3. Overlap Counting
  • 4.4. Series Pattern
  • 4.5. Joint Distribution
  • Ch. 5. Waiting-Time Distributions
  • 5.1. Introduction
  • 5.2. The Waiting Time of A Simple Pattern
  • 5.3. The Waiting Time of A Compound Pattern
  • 5.4. Probability Generating Function
  • 5.5. Mean of Waiting Time W([Lambda])
  • 5.6. More About Generating Functions
  • 5.7. Spectrum Analysis and Large Deviation Approximation
  • 5.8. Probability Generating Function of W(r, [Lambda])
  • 5.9. Scan Statistics
  • Ch. 6. Random Permutations
  • 6.1. Introduction
  • 6.2. Successions
  • 6.3. Eulerian and Simon Newcomb Numbers
  • Ch. 7. Applications
  • 7.1. Introduction
  • 7.2. System Reliability
  • 7.3. Hypothesis Testing
  • 7.4. Sequential Continuity
  • 7.5. Quality Control Schemes.