Proceedings, fifth annual conference on basic failure mechanisms and reliability in electronics /

Proceedings, fifth annual conference on basic failure mechanisms and reliability in electronics /

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Bibliographic Details
Meeting name:	Conference on Basic Failure Mechanisms and Reliability in Electronics (5th : 1964 : Newark, N.J.)
Imprint:	[S.l.] : Institute of Electrical and Electronic Engineers and Society for Advancement of Management, 1964.
Description:	1 v. (various foliations) : ill., ports. ; 28 cm.
Language:	English
Subject:	Electronic apparatus and appliances -- Reliability Reliability (Engineering) Electronic apparatus and appliances -- Reliability. Reliability (Engineering)
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/3882549

Hidden Bibliographic Details
Other title:	Basic failure mechanisms and reliability in electronics.
Other authors / contributors:	Newark College of Engineering Society for Advancement of Management Institute of Electrical and Electronics Engineers. Metropolitan New York Section.
Notes:	Cover title. "At Newark College of Engineering, Weston Hall." Includes bibliographical references.

Crerar, Lower Level, Dewey Collection

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Holdings details from Crerar, Lower Level, Dewey Collection
Call Number:	621.341 X402
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