Surface infrared and Raman spectroscopy : methods and applications /

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Bibliographic Details
Author / Creator:Suëtaka, W.
Imprint:New York : Plenum Press, c1995.
Description:xiii, 270 p. : ill. ; 24 cm.
Language:English
Series:Methods of surface characterization. v. 3
Subject:Surfaces (Technology) -- Analysis.
Infrared spectroscopy.
Raman spectroscopy.
Infrared spectroscopy.
Raman spectroscopy.
Surfaces (Technology) -- Analysis.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/3690196
Hidden Bibliographic Details
Other authors / contributors:Yates, John T., 1935-
ISBN:0306449633
Notes:Includes bibliographical references and index.
Table of Contents:
  • 1. Introduction. 1. Surface Analysis. 2. Infrared and Raman Observation of Chemical Species on Bulk Solid Substrates
  • 2. Infrared External Reflection Spectroscopy. 1. Oblique Incidence Reflection Method. 2. Polarization and Wavelength Modulation Methods. 3. Potential Modulation Method
  • 3. Internal Reflection Spectroscopy. 1. Attenuated Total Reflection Spectroscopy. 2. Absorption Enhancement by the Presence of a Metal Layer
  • 4. Infrared Emission Spectroscopy. 2. Optimum Experimental Conditions. 3. Instrumentation and Application of Infrared Emission Spectroscopy
  • 5. Surface Raman Spectroscopy. 2. Optimum Conditions for the Measurement of Surface Raman Spectra. 3. Applications
  • 6. Surface Enhanced Raman Scattering. 2. Mechanism of Enhancement. 3. Applications.