Surface infrared and Raman spectroscopy : methods and applications /

Saved in:
Bibliographic Details
Author / Creator:Suëtaka, W.
Imprint:New York : Plenum Press, c1995.
Description:xiii, 270 p. : ill. ; 24 cm.
Language:English
Series:Methods of surface characterization. v. 3
Subject:Surfaces (Technology) -- Analysis.
Infrared spectroscopy.
Raman spectroscopy.
Infrared spectroscopy.
Raman spectroscopy.
Surfaces (Technology) -- Analysis.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/3690196
Hidden Bibliographic Details
Other authors / contributors:Yates, John T., 1935-
ISBN:0306449633
Notes:Includes bibliographical references and index.
LEADER 02993cam a2200445 a 4500
001 3690196
003 ICU
005 20030527145900.0
008 950427s1995 nyua b 001 0 eng
010 |a  95018874  
020 |a 0306449633 
035 |a (NhCcYBP)YBT 95018874 
035 |a (NhCcYBP)YBP99091153459 
035 |a (OCoLC)32508286 
040 |a DLC  |c DLC  |d DLC  |d OrLoB-B  |d OCoLC 
050 0 0 |a TA418.7  |b .S74 1995 
082 0 0 |a 620/.44/028  |2 20 
100 1 |a Suëtaka, W.  |0 http://id.loc.gov/authorities/names/n95042225  |1 http://viaf.org/viaf/65716463 
245 1 0 |a Surface infrared and Raman spectroscopy :  |b methods and applications /  |c W. Suëtaka ; with the assistance of John T. Yates, Jr. 
260 |a New York :  |b Plenum Press,  |c c1995. 
300 |a xiii, 270 p. :  |b ill. ;  |c 24 cm. 
336 |a text  |b txt  |2 rdacontent  |0 http://id.loc.gov/vocabulary/contentTypes/txt 
337 |a unmediated  |b n  |2 rdamedia  |0 http://id.loc.gov/vocabulary/mediaTypes/n 
338 |a volume  |b nc  |2 rdacarrier  |0 http://id.loc.gov/vocabulary/carriers/nc 
440 0 |a Methods of surface characterization.  |v v. 3 
504 |a Includes bibliographical references and index. 
505 2 0 |g 1.  |t Introduction.  |g 1.  |t Surface Analysis.  |g 2.  |t Infrared and Raman Observation of Chemical Species on Bulk Solid Substrates --  |g 2.  |t Infrared External Reflection Spectroscopy.  |g 1.  |t Oblique Incidence Reflection Method.  |g 2.  |t Polarization and Wavelength Modulation Methods.  |g 3.  |t Potential Modulation Method --  |g 3.  |t Internal Reflection Spectroscopy.  |g 1.  |t Attenuated Total Reflection Spectroscopy.  |g 2.  |t Absorption Enhancement by the Presence of a Metal Layer --  |g 4.  |t Infrared Emission Spectroscopy.  |g 2.  |t Optimum Experimental Conditions.  |g 3.  |t Instrumentation and Application of Infrared Emission Spectroscopy --  |g 5.  |t Surface Raman Spectroscopy.  |g 2.  |t Optimum Conditions for the Measurement of Surface Raman Spectra.  |g 3.  |t Applications --  |g 6.  |t Surface Enhanced Raman Scattering.  |g 2.  |t Mechanism of Enhancement.  |g 3.  |t Applications. 
650 0 |a Surfaces (Technology)  |x Analysis.  |0 http://id.loc.gov/authorities/subjects/sh85130751 
650 0 |a Infrared spectroscopy.  |0 http://id.loc.gov/authorities/subjects/sh85066329 
650 0 |a Raman spectroscopy.  |0 http://id.loc.gov/authorities/subjects/sh85111278 
650 7 |a Infrared spectroscopy.  |2 fast  |0 http://id.worldcat.org/fast/fst00973258 
650 7 |a Raman spectroscopy.  |2 fast  |0 http://id.worldcat.org/fast/fst01089674 
650 7 |a Surfaces (Technology)  |x Analysis.  |2 fast  |0 http://id.worldcat.org/fast/fst01139279 
700 1 |a Yates, John T.,  |d 1935-  |0 http://id.loc.gov/authorities/names/n85320325  |1 http://viaf.org/viaf/109171583 
901 |a ToCBNA 
903 |a HeVa 
929 |a cat 
999 f f |i c5fb6156-1f79-5085-ba17-9339ba30eb30  |s 9aad377a-f42b-5841-bf53-024b78e9632d 
928 |t Library of Congress classification  |a TA418.7.S74 1995  |l JCL  |c JCL-Sci  |i 3640373 
927 |t Library of Congress classification  |a TA418.7.S74 1995  |l JCL  |c JCL-Sci  |e CRERAR  |b 50640458  |i 6114472