Surface infrared and Raman spectroscopy : methods and applications /
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Author / Creator: | Suëtaka, W. |
---|---|
Imprint: | New York : Plenum Press, c1995. |
Description: | xiii, 270 p. : ill. ; 24 cm. |
Language: | English |
Series: | Methods of surface characterization. v. 3 |
Subject: | Surfaces (Technology) -- Analysis. Infrared spectroscopy. Raman spectroscopy. Infrared spectroscopy. Raman spectroscopy. Surfaces (Technology) -- Analysis. |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/3690196 |
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100 | 1 | |a Suëtaka, W. |0 http://id.loc.gov/authorities/names/n95042225 |1 http://viaf.org/viaf/65716463 | |
245 | 1 | 0 | |a Surface infrared and Raman spectroscopy : |b methods and applications / |c W. Suëtaka ; with the assistance of John T. Yates, Jr. |
260 | |a New York : |b Plenum Press, |c c1995. | ||
300 | |a xiii, 270 p. : |b ill. ; |c 24 cm. | ||
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440 | 0 | |a Methods of surface characterization. |v v. 3 | |
504 | |a Includes bibliographical references and index. | ||
505 | 2 | 0 | |g 1. |t Introduction. |g 1. |t Surface Analysis. |g 2. |t Infrared and Raman Observation of Chemical Species on Bulk Solid Substrates -- |g 2. |t Infrared External Reflection Spectroscopy. |g 1. |t Oblique Incidence Reflection Method. |g 2. |t Polarization and Wavelength Modulation Methods. |g 3. |t Potential Modulation Method -- |g 3. |t Internal Reflection Spectroscopy. |g 1. |t Attenuated Total Reflection Spectroscopy. |g 2. |t Absorption Enhancement by the Presence of a Metal Layer -- |g 4. |t Infrared Emission Spectroscopy. |g 2. |t Optimum Experimental Conditions. |g 3. |t Instrumentation and Application of Infrared Emission Spectroscopy -- |g 5. |t Surface Raman Spectroscopy. |g 2. |t Optimum Conditions for the Measurement of Surface Raman Spectra. |g 3. |t Applications -- |g 6. |t Surface Enhanced Raman Scattering. |g 2. |t Mechanism of Enhancement. |g 3. |t Applications. |
650 | 0 | |a Surfaces (Technology) |x Analysis. |0 http://id.loc.gov/authorities/subjects/sh85130751 | |
650 | 0 | |a Infrared spectroscopy. |0 http://id.loc.gov/authorities/subjects/sh85066329 | |
650 | 0 | |a Raman spectroscopy. |0 http://id.loc.gov/authorities/subjects/sh85111278 | |
650 | 7 | |a Infrared spectroscopy. |2 fast |0 http://id.worldcat.org/fast/fst00973258 | |
650 | 7 | |a Raman spectroscopy. |2 fast |0 http://id.worldcat.org/fast/fst01089674 | |
650 | 7 | |a Surfaces (Technology) |x Analysis. |2 fast |0 http://id.worldcat.org/fast/fst01139279 | |
700 | 1 | |a Yates, John T., |d 1935- |0 http://id.loc.gov/authorities/names/n85320325 |1 http://viaf.org/viaf/109171583 | |
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