Monte Carlo modeling for electron microscopy and microanalysis /
Saved in:
Author / Creator: | Joy, David C., 1943- |
---|---|
Imprint: | New York : Oxford University Press, 1995. |
Description: | viii, 216 p. : ill. ; 25 cm. |
Language: | English |
Series: | Oxford series in optical and imaging sciences 9 |
Subject: | Electron microscopy -- Computer simulation. Electron probe microanalysis -- Computer simulation. Monte Carlo method. Electron microscopy -- Computer simulation. Electron probe microanalysis -- Computer simulation. Monte Carlo method. |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/2993130 |
Crerar, Lower Level, Bookstacks
Call Number: |
QH212.E4 J67 1995
|
---|---|
c.1 | Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian |