Solid-liquid electrochemical interfaces /
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Imprint: | Washington, DC : American Chemical Society, c1997. |
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Description: | xii, 354 p. : ill. ; 24 cm. |
Language: | English |
Series: | ACS symposium series 656 |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/2646738 |
Summary: | This book presents a range of applications for low-energy electron diffraction (LEED), Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). It applies both scanning tunneling and atomic force microscopy to in situ studies of structures of substrates and adsorbates during electrochemical measurements. It then presents a theoretical approach to modeling the electrochemical interface. |
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Item Description: | "Developed from a symposium sponsored by the International Chemical Congress of Pacific Basin Societies at the 1995 International Chemical Congress of Pacific Basin Societies." Held in Honolulu, Hawaii, Dec. 1995. |
Physical Description: | xii, 354 p. : ill. ; 24 cm. |
Bibliography: | Includes bibliographical references and indexes. |
ISBN: | 0841234809 |