Version 2.0 of the TXYZ thermal analysis program, TXYZ20 /

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Bibliographic Details
Author / Creator:Albers, John
Imprint:Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology : Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Description:iii, 29 p. ; 28 cm.
Language:English
Series:Semiconductor measurement technology
NIST special publication 400-89
Subject:Semiconductors -- Thermal properties
Thermal analysis -- Computer programs
Fourier analysis -- Data processing.
Format: U.S. Federal Government Document Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/1506720
Hidden Bibliographic Details
Varying Form of Title:TXYZ20
Other authors / contributors:National Institute of Standards and Technology (U.S.)
Notes:"June 1992."
Includes bibliographical references (p. 18).