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|a 1241451941
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|a 10.1007/978-981-16-0590-1
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|a (OCoLC)1241731760
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|b Springer
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|a YDX
|b eng
|e rda
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|c YDX
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|a TGMT
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| 100 |
1 |
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|a Toda, Hiroyuki,
|d 1963-
|e author.
|0 http://id.loc.gov/authorities/names/no2021050879
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| 240 |
1 |
0 |
|a Ekkususen shiti.
|l English
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| 245 |
1 |
0 |
|a X-ray CT :
|b hardware and software techniques /
|c Hiroyuki Toda.
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| 264 |
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1 |
|a Singapore :
|b Springer,
|c [2021]
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| 300 |
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|a 1 online resource (xi, 541 pages) :
|b illustrations.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
|
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|a text file
|b PDF
|2 rda
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| 504 |
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|a Includes bibliographical references and index.
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| 505 |
0 |
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|a 1. History and current status -- 2. Fundamentals of X-ray imaging -- 3. 3D image reconstruction -- 4. Hardware -- 5. Applied imaging techniques -- 6. X-ray CT scanners and their applications -- 7. Fundamentals in 3D image -- 8. 3D image processing and image analysis -- 9. 4D image analysis -- 10. Dimension and shape measurement.
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| 520 |
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|a This book provides easy-to-understand explanations to systematically and comprehensively describe the X-ray CT technologies, techniques, and skills used for industrial and scientific purposes. Included are many references along with photographs, figures, and equations prepared by the author. These features all facilitate the reader's gaining a deeper understanding of the topics being discussed. The book presents expertise not only on fundamentals but also about hardware, software, and analytical methods for the benefit of technical users. The book targets engineers, researchers, and students who are involved in research, development, design, and quality assurance in industry and academia. This publication was supported by JSPS KAKENHI Grant Number 20HP5222. .
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| 588 |
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|a Description based on resource, viewed April 28, 2021.
|
| 650 |
|
0 |
|a Imaging systems.
|0 http://id.loc.gov/authorities/subjects/sh85064471
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| 650 |
|
0 |
|a X-rays.
|0 http://id.loc.gov/authorities/subjects/sh85148749
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| 650 |
|
0 |
|a Tomography.
|0 http://id.loc.gov/authorities/subjects/sh85135955
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| 650 |
|
0 |
|a Radiography, Industrial.
|0 http://id.loc.gov/authorities/subjects/sh85110692
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| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
|
| 650 |
2 |
4 |
|a Analytical Chemistry.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/C11006
|
| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P31040
|
| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
|0 https://scigraph.springernature.com/ontologies/product-market-codes/P31090
|
| 650 |
|
7 |
|a Radiography, Industrial.
|2 fast
|0 (OCoLC)fst01432081
|
| 650 |
|
7 |
|a X-rays.
|2 fast
|0 (OCoLC)fst01181857
|
| 650 |
|
7 |
|a Tomography.
|2 fast
|0 (OCoLC)fst01152453
|
| 650 |
|
7 |
|a Imaging systems.
|2 fast
|0 (OCoLC)fst00967605
|
| 650 |
|
7 |
|a Analytical chemistry.
|2 fast
|0 (OCoLC)fst00853459
|
| 650 |
|
7 |
|a Materials science.
|2 fast
|0 (OCoLC)fst01011957
|
| 650 |
|
7 |
|a Measurement.
|2 fast
|0 (OCoLC)fst01715944
|
| 650 |
|
7 |
|a Microscopy.
|2 fast
|0 (OCoLC)fst01020062
|
| 650 |
|
7 |
|a Physical measurements.
|2 fast
|0 (OCoLC)fst01062700
|
| 650 |
|
7 |
|a Spectrum analysis.
|2 fast
|0 (OCoLC)fst01129108
|
| 655 |
|
4 |
|a Electronic books.
|
| 776 |
0 |
8 |
|i Print version:
|z 9811605890
|z 9789811605895
|w (OCoLC)1235468847
|
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|t Library of Congress classification
|a RC78.7.T6
|l Online
|c UC-FullText
|u https://link.springer.com/10.1007/978-981-16-0590-1
|z Springer Nature
|g ebooks
|i 12627919
|
