Theory of intense beams of charged particles / optics of charged particle analyzers.

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Bibliographic Details
Imprint:Oxford : Academic, 2011.
Description:1 online resource (539 pages)
Subject:Particle beams.
Particle beams.
Electronic books.
Format: E-Resource Book
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Other authors / contributors:Hawkes, P. W.
Notes:Print version record.
Summary:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians.
Other form:Print version: Theory of intense beams of charged particles. Oxford : Academic, 2011 Is reproduction of (manifestation) : 9786613164018
Standard no.:9786613164018