Optics of charged particle analyzers /
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Author / Creator: | Yavor, Mikhail. |
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Edition: | 1st ed. |
Imprint: | Amsterdam ; Boston : Academic Press, 2009. |
Description: | 1 online resource (xxiii, 381 pages) : illustrations. |
Language: | English |
Series: | Advances in imaging and electron physics ; v. 157 Advances in imaging and electron physics ; 157. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/12377605 |
Table of Contents:
- Charged particles in electromagnetic fields
- Language of aberration expansions in charged particle optics
- Transporting charged particle beams in static fields
- Transporting charged particles in radiofrequency fields
- Static magnetic charged particle analyzers
- Electrostatic energy analyzers
- Mass analyzers with combined electrostatic and magnetic fields
- Time-of-flight mass analyzers
- Radiofrequency mass analyzers.