Optics of charged particle analyzers /

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Bibliographic Details
Author / Creator:Yavor, Mikhail.
Edition:1st ed.
Imprint:Amsterdam ; Boston : Academic Press, 2009.
Description:1 online resource (xxiii, 381 pages) : illustrations.
Series:Advances in imaging and electron physics ; v. 157
Advances in imaging and electron physics ; 157.
Subject:Particles (Nuclear physics)
Electron optics.
Nuclear physics -- Instruments.
SCIENCE -- Physics -- Nuclear.
SCIENCE -- Physics -- Atomic & Molecular.
Electron optics.
Nuclear physics -- Instruments.
Particles (Nuclear physics)
Electronic books.
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12377605
Hidden Bibliographic Details
Notes:Included bibliographical references and index.
Print version record.
Summary:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians.
Other form:Print version: Yavor, Mikhail. Optics of charged particle analyzers. 1st ed. Amsterdam ; Boston : Academic Press, 2009 9780123747686