EM material characterization techniques for metamaterials /

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Bibliographic Details
Imprint:Singapore : Springer, [2018]
Description:1 online resource
Language:English
Series:SpringerBriefs in electrical and computer engineering. Computational electromagnetics, 2191-8112
SpringerBriefs in electrical and computer engineering. Computational electromagnetics.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11541733
Hidden Bibliographic Details
Other authors / contributors:Nair, Raveendranath U., author.
Dutta, Maumita, author.
P. S., Mohammed Yazeen, author.
Venu, K. S., author.
ISBN:9789811065170
9811065179
9811065160
9789811065163
9789811065163
Digital file characteristics:text file PDF
Notes:Includes indexes.
Includes bibliographical references and indexes.
Online resource; title from PDF title page (SpringerLink, viewed September 28, 2017).
Summary:This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.
Other form:Printed edition: 9789811065163
Standard no.:10.1007/978-981-10-6517-0