Terahertz metrology /

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Bibliographic Details
Imprint:Boston : Artech House, [2015]
©2015
Description:1 online resource (386 pages) : illustrations
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11241620
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Other authors / contributors:Naftaly, Mira, editor.
ISBN:9781608077779
1608077772
9781608077762
1608077764
Notes:Includes bibliographical references and index.
Summary:This new book describes modern terahertz (THz) systems and devices and presents practical techniques for accurate measurement with an emphasis on evaluating uncertainties and identifying sources of error. This is the first THz book on the market to address measurement methodologies and issues -- perfect for practitioners and aspiring practitioners wishing to learn good measurement practice and avoid pitfalls. This book provides a brief review of different THz systems and devices, followed by chapters detailing the measurement issues encountered in using each of the main types of THz systems, and a guide to performing measurements rigorously. Particular attention is given to evaluating uncertainties, and recognizing potential sources of errors. The main focus is on time-domain spectroscopy, by far the most widely used technique. Readers are also presented with examples of applications with the emphasis on utility, both in research and in industry.
Other form:Print version: 9781608077762