Silicon-based millimeter-wave technology measurement, modeling and applications /

Silicon-based millimeter-wave technology measurement, modeling and applications /

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Bibliographic Details
Imprint:Amsterdam : Elsevier/Academic Press, 2012.
Description:1 online resource (xx, 483 pages) : illustrations.
Language:English
Series:Advances in imaging and electron physics ; v. 174
Advances in imaging and electron physics ; v. 174.
Subject:Millimeter wave devices.
Silicon crystals.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
Millimeter wave devices.
Silicon crystals.
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11169419
Hidden Bibliographic Details
Other authors / contributors:Cremer, Jay Theodore, Jr.
ISBN:9780123946362
0123946360
9780123942982
Notes:Includes bibliographical references and index.
Summary:Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: Contributions from leading authorities. Informs and updates on all the latest developments in the field.
Other form:Print version: Deen, Jamal. Silicon-Based Millimetre-wave Technology. San Diego : Elsevier Science, ©2013 9780123942982

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