X-ray absorption spectroscopy of semiconductors /

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Bibliographic Details
Imprint:Heidelberg : Springer, [2014]
©2015
Description:1 online resource (xvi, 361 pages) : illustrations (some color).
Language:English
Series:Springer Series in Optical Sciences, 0342-4111 ; volume 190
Springer series in optical sciences ; volume 190.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11090922
Hidden Bibliographic Details
Other authors / contributors:Schnohr, Claudia S., editor.
Ridgway, M. C. (Mark C.), editor.
ISBN:9783662443620
3662443627
9783662443613
Notes:Includes bibliographical references and index.
Online resource; title from PDF title page (SpringerLink, viewed December 15, 2014).
Standard no.:10.1007/978-3-662-44362-0

MARC

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588 0 |a Online resource; title from PDF title page (SpringerLink, viewed December 15, 2014). 
650 0 |a Semiconductors  |x Testing. 
650 0 |a X-rays  |x Industrial applications. 
650 0 |a X-ray spectroscopy. 
650 2 4 |a Optical and Electronic Materials. 
650 2 4 |a Spectroscopy and Microscopy. 
650 2 4 |a Characterization and Evaluation of Materials. 
650 2 4 |a Optics and Electrodynamics. 
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650 7 |a X-ray spectroscopy.  |2 fast  |0 (OCoLC)fst01181847 
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