X-ray absorption spectroscopy of semiconductors /

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Bibliographic Details
Imprint:Heidelberg : Springer, [2014]
Description:1 online resource (xvi, 361 pages) : illustrations (some color).
Series:Springer Series in Optical Sciences, 0342-4111 ; volume 190
Springer series in optical sciences ; volume 190.
Subject:Semiconductors -- Testing.
X-rays -- Industrial applications.
X-ray spectroscopy.
Optical and Electronic Materials.
Spectroscopy and Microscopy.
Characterization and Evaluation of Materials.
Optics and Electrodynamics.
Semiconductors -- Testing.
X-ray spectroscopy.
X-rays -- Industrial applications.
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11090922
Hidden Bibliographic Details
Other authors / contributors:Schnohr, Claudia S., editor.
Ridgway, M. C. (Mark C.), editor.
Notes:Includes bibliographical references and index.
Online resource; title from PDF title page (SpringerLink, viewed December 15, 2014).
Standard no.:10.1007/978-3-662-44362-0