Frontiers in optical methods : nano-characterization and coherent control /

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Bibliographic Details
Imprint:	Heidelberg : Springer, 2014. ©2014
Description:	1 online resource (xii, 228 pages) : illustrations (some color).
Language:	English
Series:	Springer Series in Optical Sciences, 0342-4111 ; 180 Springer series in optical sciences ; 180.
Subject:	Reflectance spectroscopy. Terahertz spectroscopy. Coherence (Optics) Coherence (Optics) Reflectance spectroscopy. Terahertz spectroscopy.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11083320

Hidden Bibliographic Details
Other authors / contributors:	Shudo, Ken-ichi, editor. Katayama, Ikufumui, 1977- editor. Ohno, Shin-ya, editor.
ISBN:	9783642405945 3642405940 3642405932 9783642405938 9783642405938
Notes:	Includes bibliographical references and index. Online resource; title from PDF title page (SpringerLink, viewed December 10, 2013).
Summary:	This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
Other form:	Printed edition: 9783642405938
Standard no.:	10.1007/978-3-642-40594-5

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